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About the presentation

Surface data not only contains information about functionality of a product but also gives hints about the environmental conditions, like processing parameters or vibration. There are different methods to obtain such information and white light interferometers are accepted to be one of the most powerful tools for surface metrology. Besides other metrological characteristics, its vertical resolution at the nanometer level enables the acquisition of important details in topography. At the same time, effects of environmental factors like uncontrolled movement or vibrations can be seen in the measurement data if some precautions are not taken. In this presentation, a new method which reduces the effects of environmental disturbances is described.

Registration
Powered by AMT and managed by GIE Media, The IMTS 2022 Conference features 69 different sessions you won’t want to miss so register today. Focused on a range of topics that include process innovation, plant operations, quality/inspection, and automation, The IMTS 2022 Conference addresses improving productivity; improving part quality; and developing a stable, competent workforce to lower the cost of manufacturing in the United States and create new levels of market demand.

Meet your presenter

Özgür Tan is the strategical product management (SPM) lead for optical surface metrology at Polytec GmbH, Germany. Before that, he was a product manager at Leica Microsystems GmbH from 2011 to 2015 and an expert for metrology and inspection at BOSCH GmbH from 2003-2007. He has a master’s degree and Ph.D. in metrology from University of Erlangen, Germany.

About the company
Polytec has more than 400 employees worldwide. We develop, produce, and distribute optical measurement technology solutions for research and industry. Our quality innovative products have an excellent reputation internationally among the expert community. We find solutions tailored to our customers’ requirements on a day-to-day basis.